Tuesday, April 9, 2013
4:00pm – 4:30pm CST
Dynamic Imaging and Analytical Techniques for Chemistry and Catalysis Research
Joerg R. Jinschek and Daniel Phifer from FEI
Learn how advancements in electron microscopy make this technique increasingly valuable for chemistry researchers. Applications presented include 2D and 3D chemical mapping for studying catalysts, particles and surface structure; environmental transmission electron microscopy (ETEM) for observing heterogeneous catalysts in working states; and environmental scanning electron microscopy (ESEM) for dynamic study of materials and particles, including self-assembly processes.
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Meet The Experts
Joerg R. Jinschek has a Dr. rer. nat degree in physics from the Friedrich Schiller University in Jena, Germany. He was a postdoc at the National Center for Electron Microscopy at Lawrence Berkeley National Lab, before moving to Virginia Tech University as a Research Assistant Professor. Joerg joined FEI in 2008 as a Senior Research Scientist.
Daniel Phifer has a B.A. from Auburn University and a M.S. from the University of Tennessee. Prior to joining FEI, Daniel was at the Oak Ridge National Lab in Tennessee, where he worked directly with David Joy and other top materials scientists. In his 16 years with FEI, Daniel has worked extensively with environmental SEM (ESEM) as well as traditional SEM and DualBeam microscopy.
About our Sponsors
FEI’s imaging and analysis solutions include: ChemiSTEM™ Technology for 2D and 3D chemical composition determination, including light elements, for study of catalysts, particles and surface structure; Environmental Transmission Electron Microscope (ETEM) for atomic scale structure-function relationship of heterogeneous catalysts and investigation of gas-solid interactions; Environmental Scanning Electron Microscope (ESEM) for study of particles and materials, and dynamic studies including self-assembly processes.
The Fine Print
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